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ASME
Measurement Standards B89.3.1-1972(R2003) Reaffirmed Date: 2003 This standard covers the specification and measurement of out-of-roundness of a surface of revolution by the evaluation of a typical cross- sectional profile in terms of its radial deviations from a defined center. While this standard deals primarily with precision spindle instruments for out-of-roundness measurement and polar chart presentation, it is not the intent here to exclude other methods, which will provide valid radial deviation data. This standard does not define the design requirements for roundness suitable for specific purposes, nor does it specify the manufacturing process for production of roundness. Application, shall continue to be recognized as commercial and in no way be construed as non-standard. Largest volume of present needs of users and, therefore, may be manufactured on a production basis. The second category of this standard shall include sizes, which are classified as special. Realistic tolerances which can be readily met with modern equipment have been established that will insure a high grade tool which can be maintained economically in respect to both the component parts and the die set assembly. Die sets covered in this standard are those as stated above and are both heavy and light duty. The die sets shown are of the conventional type with pressed in guide posts and press fit guide post bushings or with demountable guide posts and demountable guide post bushings or any combination thereof. The standard die areas may also apply to die sets with patented mountings for the guide posts and guide post bushings. There are in existence several different types of special guide posts and guide post bushings, some of which are proprietary in nature and therefore are not included in this standard. Published: 1972 STANDARDS QUICK FIND A13, A17, A18.18.1, A18.1, A90, A112, A120, AG, B1, B4, B5, B16, B17, B18 CU, B18 M, B20, B27.6, B27.7, B27.8M, B29, B30, B31, B32, B36, B40, B46, B47, B73, B89, B94, B107, BPE, BTH, CSD, HPS, HST, MFC, MH1, N278, N509, N510, NOG, NQA, NUM, OM, PALD, PCC, PTC, PVHO, QAI, QEI, QFO, QHO, QME, QMO, QRO, RA-S, RTP, SI, STS,TDP, Y14, Y32, |
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