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ISTFA ’96: 22nd International Symposium for Testing and Failure Analysis
1996 by ASM International, hardbound, 370 pages, ISBN 0-87170-582-6
$154.00
This resource covers the largest conference worldwide for fault-finding procedures, diagnostic techniques, and failure analysis. Held in Los Angeles, CA, it is a vital forum for the exchange of technical information, practice, and experience. This conference continues to emphasize current and emerging techniques and technologies used for failure analysis, plus screening tests on electronic systems and components. Topics covered include process analysis techniques, packaging/assembly, related analysis techniques, EOS/ESD, nonsilicon devices, vendor-equipment topics, testing, and comprehensive case studies.
